Indoor Air Quality in Buildings and Facilities Utilized for the Cultivation and Post-Harvest Process...
1.1 This Standard provides minimum indoor air quality (IAQ) requirements and guidelines for a building
or portions of a building utilized for cannabis cultivation, post-harvest processing as well as ancillary
spaces.
Note: For the purposes of this Standard, ancillary spaces include areas that support the general operations required to run a
cannabis facility. Examples include but are not…
Qualité de l'air intérieur dans les bâtiments et les installations utilisés pour la culture et ...
1.1 Cette norme fournit des exigences minimales en matière de qualité de l’air intérieur (IAQ) et des
lignes directrices pour un bâtiment ou des parties d’un bâtiment utilisé pour la culture du cannabis, la
transformation post-récolte et les espaces auxiliaires.
Remarque : Aux fins de la présente norme, les espaces auxiliaires comprennent les zones prenant en charge les opérations
générales…
1 Scope
1.1 This standard specifies the requirements for devices intended for positioning, which may include
bundling, routing, locating, and securing of cable, wire, conduit, or tubing used in a wiring system in
electrical installations in accordance with CSA C22.1, Canadian Electrical Code (CE Code), Part I, in
Canada and the National Electrical Code (NEC), NFPA 70 in the United States of…
Fibre optic communication subsystem test procedures - Part 4-3: Installed passive optical networks -...
IEC 61280-4-3: 2022 describes the measurement of attenuation, optical return loss and optical power in installed passive optical networks (PONs) using single-mode fibre. This document specifies two methods for measuring the attenuation before activation of the PON:
method A: one-cord method using a light source and a power meter (LSPM);
method B: optical time-domain reflectometer (OTDR)…
Procédures d’essai des sous-systèmes de télécommunications fibroniques - Partie 4-3: Installations d...
IEC 61280-4-3: 2022 décrit la mesure de l’affaiblissement, de l’affaiblissement de réflexion optique et de la puissance optique dans des installations de réseau optique passif (PON) utilisant de la fibre unimodale. Le présent document spécifie deux méthodes pour mesurer l’affaiblissement avant l’activation du PON:
méthode A: méthode à cordon unique utilisant une source optique et un mesureur…
Protocol for management of electric vehicles charging and discharging infrastructures - Part 1: Basi...
IEC 63110-1:2022, as a basis for the other parts of IEC 63110, covers the definitions, use cases and architecture for the management of electric vehicle charging and discharging infrastructures.
It addresses the general requirements for the establishment of an e-mobility eco-system, therefore covering the communication flows between different e-mobility actors as well as data flows with the…
Protocole de gestion des infrastructures de charge et de décharge des véhicules électriques - Partie...
L'IEC 63110-1:2022, qui sert de base aux autres parties de l'IEC 63110, couvre les définitions, cas d'utilisation et architectures pour la gestion des infrastructures de charge et de décharge des véhicules électriques.
Elle porte sur les exigences générales relatives à la mise en place d'un écosystème de mobilité électrique et couvre donc les flux de communication entre les…
Telecommunications and information exchange between systems — Specific requirements for local and me...
The scope of this standard is to define one medium access control (MAC) and several physical layer (PHY) specifications for wireless connectivity for fixed, portable, and moving stations (STAs) within a local area.
Telecommunications and information exchange between systems - Specific requirements for local and me...
The scope of this standard is to define one medium access control (MAC) and several physical layer (PHY) specifications for wireless connectivity for fixed, portable, and moving stations (STAs) within a local area.
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepita...
IEC 63068-4:2022(E) provides a procedure for identifying and evaluating defects in as-grown 4H-SiC (Silicon Carbide) homoepitaxial wafer by systematically combining two test methods of optical inspection and photoluminescence (PL). Additionally, this document exemplifies optical inspection and PL images to enable the detection and categorization of defects in SiC homoepitaxial wafers.
