Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing...
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
Cards and security devices for personal identification - Test methods - Part 6: Contactless proximi...
The ISO/IEC 10373 series defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications.
NOTE 1 Criteria for…
Cards and security devices for personal identification — Test methods — Part 6: Contactless proximi...
The ISO/IEC 10373 series defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications.
NOTE 1 Criteria for…
Luminaires - Part 2-23: Particular requirements - Extra-low-voltage lighting systems for ELV light s...
IEC 60598-2-23:2020 specifies requirements for extra-low-voltage lighting systems for ELV light sources, intended for ordinary interior use on supply voltages not exceeding 1 000 V. The luminaires, being connected in parallel, are supplied via freely suspended continuous supporting conductors or profiles, the current in the ELV part of the system not exceeding 25 A.
This second edition cancels…
Transformers and inductors for use in electronic and telecommunication equipment - Measuring methods...
IEC 61007:2020 describes a number of tests for use in determining the significant parameters and performance characteristics of transformers and inductors for use in electronics and telecommunication equipment. These test methods are designed primarily for transformers and inductors used in all types of electronics applications that can be involved in any specification for such components. Even…
This document gives an overview on the terms and definitions of foundry machinery that are commonly and widely used.
It applies to standard development in the foundry machinery field, technical documentation, related scientific and technical publications, etc.
Thermoplastics piping systems for underground non-pressure applications — Test method for leaktightn...
This document specifies a test method for determining the leaktightness of elastomeric sealing ring type joints for buried thermoplastics non-pressure piping systems.
Unless otherwise specified in the referring standard, the tests are carried out at the following basic test pressures:
— p1: internal negative air pressure (partial vacuum);
— p2: a low internal hydrostatic pressure;
—…
Junction boxes for photovoltaic modules - Safety requirements and tests
IEC 62790:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 62790:2020 describes safety requirements, constructional requirements and tests for junction boxes up to 1 500 V DC…
Junction boxes for photovoltaic modules - Safety requirements and tests
IEC 62790:2020 describes safety requirements, constructional requirements and tests for junction boxes up to 1 500 V DC for use on photovoltaic modules in accordance with class II of IEC 61140:2016.
This document applies also to enclosures mounted on PV-modules containing electronic circuits for converting, controlling, monitoring or similar operations. Additional requirements concerning the…
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60747-16-5:2013+A1:2020 specifies the terminology, essential ratings and characteristics, and measuring methods of microwave integrated circuit oscillators. This standard is applicable to the fixed and voltage-controlled semiconductor microwave oscillator devices, except the oscillator modules such as synthesizers which require external controllers.<br />
<strong>This consolidated…
