Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequenc...
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
Gas analyzers - Expression of performance - Part 3: Paramagnetic oxygen analyzers
Applies to the following main measuring methods: automatic null balance, thermomagnetic or mangetic wind and differential pressure or "Quinke". Deals with ancillary units and applies to analyzers installed both indoors and outdoors. Indends to specify terminology and definitions, unify methods, specify tests and provide basic documents to support the application of standards of quality…
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measureme...
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
Animal and vegetable fats and oils — Determination of content of polar compounds
This International Standard describes a method for the determination of the content of polar compounds in animal and vegetable fats and oils.
Polar compounds are formed during the heating of fats and oils and thus the method serves to assess the deterioration of frying fats and oils with use.
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been…
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
This test is applicable for all package types. The test should be considered non-destructive.
The contents of the corrigendum of August 2003 have…
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
The contents of the corrigendum of August 2003 have been included in this copy.
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, high...
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
The contents of the corrigendum of August 2003 have been included in this copy.
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature ...
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of…
