Standard Test Method for Determination of Long-Term Thermal Resistance of Closed-Cell Thermal Insula...
Scope
1.1 This procedure defines the long-term thermal resistance (LTTR) of a foam product as the value
measured after 5-year storage in a laboratory environment and provides means for its prediction based on
an accelerated laboratory test.
1.2 This procedure, based on ASTM standard test methods ASTM C1303 and ASTM C518, can be
applied to a wide range of preformed as well as field…
Méthode d’essai normalisée pour la détermination de la résistance thermique à long terme des mousses...
Domaine d’application
1.1 Cette procédure définit la résistance thermique à long terme (RTLT) d’un produit de mousse comme
étant la valeur mesuré après 5 ans d’entreposage dans un environnement de laboratoire et fournit des
moyens de prédiction basés sur un essai accéléré en laboratoire.
1.2 Cette procédure, basée sur les méthodes d’essai normalisées ASTM ASTM C1303 et ASTM C518,
peut être…
IEC 60404-1:2016+AMD1:2025 CSV is intended to classify commercially available magnetic materials. The term "magnetic materials" denotes substances where the application requires the existence of ferromagnetic or ferrimagnetic properties. The classification of magnetic materials is based upon the generally recognized existence of two main groups of products:
- soft magnetic materials (…
Information technology - Common Biometric Exchange Formats Framework - Part 4: Security block format...
This document specifies security block (SB) formats (see ISO/IEC 19785-1) registered in accordance with ISO/IEC 19785-2 as formats defined by the Common Biometric Exchange Formats Framework (CBEFF) biometric organization ISO/IEC JTC 1/SC 37. This document also specifies registered SB format identifiers.
NOTE The SB format identifier is recorded in the standard biometric header (SBH) of…
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -...
IEC 61300-2-5:2022+AMD1:2025 CSV determines the ability of the cable attachment element of the device under test (DUT) to withstand torsional loads that can be experienced during installation and normal service. This fourth edition cancels and replaces the third edition published in 2009. This edition constitutes a technical revision.
This edition includes the following significant technical…
