Petroleum and related products — Precision of measurement methods and results — Part 5: Statistical ...
This document specifies statistical methodology for assessing the expected agreement between two test methods that purport to measure the same property of a material, and for deciding if a simple linear bias correction can further improve the expected agreement.
This document is applicable for analytical methods which measure quantitative properties of petroleum or petroleum products resulting…
Computer graphics, image processing and environmental data representation — Extensible 3D (X3D) — Pa...
ISO/IEC 19775 Extensible 3D (X3D) defines a software system that integrates network-enabled 3D graphics and multimedia. Conceptually, each X3D application is a 3D time-based space that contains graphic and aural objects that can be dynamically modified through a variety of mechanisms. This document defines the architecture and base components of X3D.
The semantics of X3D describe an abstract…
This document defines a set of metadata to support the audit trail of the transformation of a geometry definition, while it is distributed and shared in supply-chains, to ensure the traceability of geometric model data. It also defines a set of web services based on the utilisation of these metadata.
The following are within the scope of this document:
— metadata definitions for geometry…
Imaging materials — Reflection colour photographic prints — Method for testing humidity fastness
This document describes test methods for evaluating reflection colour photographic prints with regard to changes in image appearance resulting from exposure to high relative humidity.
NOTE Testing under low humidity conditions is described in ISO 18949.
The observed changes relate to colour, tone and loss of sharpness caused by horizontal and vertical diffusion of colorants from…
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humi...
IEC 60749-5:2023 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 60749-5:2023 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-…
LED packages - Long-term luminous, radiant and photon flux maintenance projection
IEC 63013:2017+AMD1:2021+AMD2:2023 CSV is applicable to LED packages for general lighting services. It specifies procedures and conditions for measuring the luminous flux maintenance of LED packages. It also provides the procedures and conditions (criteria) of projecting the long-term luminous flux maintenance based on limited luminous flux maintenance test data collected. Within the context of…
LED encapsulées - Projection à long terme concernant la conservation du flux lumineux, du flux énerg...
L'IEC 63013:2017+AMD1:2021+AMD2:2023 CSV est applicable aux LED encapsulées d'utilisation courante. Elle spécifie les procédures et les conditions pour mesurer la conservation du flux lumineux des LED encapsulées. Elle stipule également les procédures et les conditions (critères) de projection de la conservation du flux lumineux à long terme en se fondant sur des données d'essais…
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humi...
IEC 60749-5:2023 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive. This edition includes the following significant technical changes with respect to the previous edition:
a) The specification of the test equipment is changed to require the…
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5: Essai c...
L’IEC 60749-5:2023 décrit un essai continu de durée de vie utilisant la température et l’humidité avec polarisation pour évaluer la fiabilité des dispositifs à semiconducteurs sous boîtier non hermétique dans les environnements humides. Cette méthode d’essai est considérée comme destructive. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition…