Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
IEC 60747-5-4:2022+AMD1:2024 CSV specifies the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
This edition includes the following significant technical changes with respect to the previous edition:
- References for the terms and definitions related to the lighting area, IEC 60050-845, are revised based on IEC 60050-845:2020;
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Information technology — JPEG Systems — Part 10: Reference software
This document specifies a reference software implementation of ISO/IEC 19566-5. The reference software is accompanied with a reference dataset which provides an extensive list of the various JUMBF data structures specified in ISO/IEC 19566-5.
Computer graphics, image processing and environmental data representation — Spatial reference model ...
This document specifies the C++ programming language layer for the language independent application program interface (API) of the Spatial Reference Model (SRM), ISO/IEC 18026.
Traditional Chinese medicine — Test method for moxa floss quality — Concentration of waste particles
This document specifies test methods for the quality assessment of moxa floss. It covers sample preparation, measurement and calculation of the concentration of waste particle, and delivery of moxa floss quality information.
This document is applicable to any moxa floss products and moxa floss used in the moxibustion devices. It is not applicable to the moxa floss which is hardened with chemical…
