Information technology — TLS specification for storage systems
This document details the requirements for use of the Transport Layer Security (TLS) protocol in conjunction with data storage technologies. The requirements set out in this document are intended to facilitate secure interoperability of storage clients and servers as well as non-storage technologies that may have similar interoperability needs.
This document is relevant to anyone involved in…
Control charts — Part 6: EWMA control charts for the process mean
This document covers EWMA control charts, originally proposed by Roberts (1959)[16], as a statistical process control technique to detect small shifts in the process mean. It makes possible the faster detection of small to moderate shifts in the process mean. In this chart, the process mean is evaluated in terms of exponentially weighted moving average of all previous observations or averages.…
Information technology - TLS specification for storage systems
This document details the requirements for use of the Transport Layer Security (TLS) protocol in conjunction with data storage technologies. The requirements set out in this document are intended to facilitate secure interoperability of storage clients and servers as well as non-storage technologies that may have similar interoperability needs.
This document is relevant to anyone involved in…
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nan...
IEC 62024-1:2024 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 62024-1:2024 specifies the electrical characteristics and measuring methods for the nanohenry range chip inductor…
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nan...
IEC 62024-1:2024 specifies the electrical characteristics and measuring methods for the nanohenry range chip inductor that is normally used in the high frequency (over 100 kHz) range.
This edition includes the following significant technical changes with respect to the previous edition:
a) addition of S parameter measurement;
b) addition of the inductance, Q-factor and impedance of an inductor…
Fibre optic communication subsystem test procedures - Part 2-13: Digital systems - Measurement of er...
IEC 61280-2-13:2024 series defines a procedure for calculating the root-mean-square error vector magnitude of optical n-APSK signals from a set of measured symbols. It specifically defines the normalization of the reference states and a procedure for optimal scaling of the measured symbol states. The procedure described in this document applies to single-polarized optical signals as well as to…